Estimation of reliable range of electron temperature measurements with sets of given optical bandpass filters for KSTAR Thomson scattering system based on synthetic Thomson data

摘要

One factor determining the reliability of measurements of electrontemperature using a Thomson scattering (TS) system is transmittance of theoptical bandpass filters in polychromators. We investigate the systemperformance as a function of electron temperature to determine reliable rangeof measurements for a given set of the optical bandpass filters. We show thatsuch a reliability, i.e., both bias and random errors, can be obtained bybuilding a forward model of the KSTAR TS system to generate synthetic TS datawith the prescribed electron temperature and density profiles. The prescribedprofiles are compared with the estimated ones to quantify both bias and randomerrors.